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CMPUG Announcements

NCCAVS CMPUG April Meeting – CALL FOR ABSTRACTS

TOPIC: Advances in CMP Consumables, Materials and Tools

OPTIONAL TOUR:
12:00-12:45 p.m. (Central Time)
3M Innovation Center (limited to 50 people and must be registered by April 3rd)

MEETING DATE:  April 8, 2026 (Hybrid Meeting)

TIME: 1:00 p.m.-5:30 p.m. (Central Time) – check your time zone

LOCATION: 3M Company Innovation Center
2350 Minnehaha Ave. E
St. Paul, MN 55119

SECURITY NOTE: Official government IDs are required for entry into the 3M site, (Domestic and International guests), This is a site security mandate that cannot be by-passed.   

PLATFORM: Zoom

REGISTER: Free to Attend – Advance Registration Required for Security Approval

     REGISTER BY APRIL 3, 2026 – If you plan to attend in person and/or signing up for the tour!

     Registration for virtual attendance will remain open through April 8th.

(Zoom login details provided upon registration, whether attending virtually or in person)

REGISTER FREE

CO-CHAIRS:

Michael Pevny, 3M Company, mpevny@mmm.com
Bahar Basim, gbbasim@yahoo.com

AGENDA/SPEAKERS

1:00 pm – Welcome and Acknowledgment of Sponsors, Co-Chairs Michael Pevny (3M), Bahar Basim

1:10 pm – PLENARY TALK – CMP Process Challenges in Logic vs. Memory: High-Volume Manufacturing and Technology Development Enhanced by AI, Veera Dandu, Sandisk

1:40 pm – Measure What You Polish: Optical Measurement Techniques for CMP Consumables and Wafer Surface Characterization, Etienne Babnik, Nanofocus

2:05 pm  –  Impact of Sub-optimal Pad Conditioning Recipes on Process Vibrations in Copper CMP, Dr. Ara Philipposian, Araca Inc

2:30 pm – Addressing Polishing By-Products in Advanced Metals CMP Solution Development, Kevin Dockery, Entegris

2:55 pm – Effects of Conditioning Disc Designs on the Tribological, Vibrational, Thermal, Kinetic, Pad Micro-Textural and Pad Wear Characteristics of Silicon Carbide CMP Processes, Thomas Mooney, 3M Company

3:20 pm – Announcements/Coffee Break

3:50 pm – Correlative Microscopy and Nanoscale Chemical Mapping for CMP Defect Root Cause Analysis, Valerie Brogden, Covalent 

4:15 pm – CMP Solutions for Advanced Panel Solutions, Sunghoon Lee, KC Tech

4:40 pm – A Viscosity Measurement Technique for Ultra-low Sample Volumes, Professor Mahesh Tirumkudulu, Rheoheme Pvt Ltd

5:05 pm – Panel Discussion, Semiconductor Manufacturing Mentoring Program

5:30 pm –  Closing Remarks

7:00 pm – Offsite Dinner in St. Paul Area

All presentations from this meeting will be posted on the CMPUG Proceedings webpage ~2 weeks following the meeting.

Platinum Sponsors

Gold Sponsors

Sponsorship

If you would like to sponsor a 2026* User Group (CMPUG, JTG, PAG, or TFUG) meeting, click the “BE A SPONSOR” button.

BE A SPONSOR!

*2026 CMPUG Schedule is posted

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